Re: Error codes

[jfenske@muug.mb.ca (John Fenske)]

In <2qh7l2$6vq@news.ysu.edu> ag471@yfn.ysu.edu (Eric S. Ford) writes:

>Where is the //GS built-in test documented and the error codes explained?

Error Format: AABBCCDD
 
AA =    01: ROM Test
BB =    Failed checksum
DD =    01 if the test encountered bad RAM
 
AA =    02: RAM Test
BB =    Bank Number (or $FF for ADB Tool call error)
CC =    Bit(s) failed
 
AA =    03: Soft Switches and State Register Test
BB =    State Register bit (if any)
CC =    Low byte of soft switch address
 
AA =    04: RAM Address Test
BB =    Failed bank number (or $FF for ADB Tool call error)
CCDD =  Failed address
 
AA =    05: Speed Test
BB =    01:  Speed stuck slow
        02:  Speed stuck fast
 
AA =    06: Serial Test
BB =    01:  Register R/W
        04:  Tx Buffer empty status
        05:  Tx Buffer empty failure
        06:  All Sent Status fail
        07:  Rx Char available
        08:  Bad data
 
AA =    07: Clock Test
DD =    01:  Fatal error occurred and the test is aborted
 
AA =    08: Battery RAM Test
BB =    01:  Address test and CC = bad address
        02:  Non-volatile RAM failed and CC = pattern, DD = address
 
AA =    09: Apple Desktop Bus Test
BBCC =  Bad checksum
DD =    01:  Apple Desktop Bus tools call encountered a fatal error
 
AA =    0A: Shadow Register Test
BB =    01:  Text page 1 fail
        02:  Text page 2 fail
        03:  Apple Desktop Bus Tool call error
        04:  Power On Clear bit error
 
AA =    0B : Interrupts Test
BB =    01:  VBL interrupt time-out
        02:  VBL IRQ status fail
        03:  1/4 sec interrupt
        04:  1/4 sec interrupt
        06:  VGC IRQ
        07:  Scan line
 
AA =    0C :  Sound Test
DD =    01:  RAM data error
        02:  RAM address error
        03:  Data register failed
        04:  Control register failed
        05:  Oscillator interrupt timeout